Picture of AFM - Dimension 3100
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Atomic force microscope from Digital Instruments, Dimension 3100. General characterization instrument. Installed 2005. Location: room Q161, Nano-process lab.

Tool name:
AFM - Dimension 3100
Area/room:
Nano-process area
Category:
Metrology
Manufacturer:
Veeco Instruments Inc.
Model:
D3100 Nanoscope IIIa

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