Tools
All tools
Tool status
Info
General documents
Sitemap
User access
Login
NanoLund
Chalmers
Electrum
Ångström
MyFab - The Swedish Micro and Nano Fabrication Network
No access?
Apply for access
here...
Login
U
sername:
P
assword:
User Name is required.
Password is required.
Forgot your password?
SEM - Hitachi SU8010 (705)
Current status:
AVAILABLE
Book
|
Log
|
Show/Collapse all
Responsibles
1st Responsible:
Peter Blomqvist
Process:
Files
You must be logged in to view files.
Description
Hitachi SU8010 Cold Field Emission SEM
High resolution SEM with backscatter detection and cold trap, 5 motorized axis with loadlock
Mounted on an active vibration canceling system
Resolution: 1.0 nm @ 15kV
Detectors: In-lens SE & E-T SE, STEM
In-situ EBIC & I-V measurements
Location: Q260
Details
Tool name:
SEM - Hitachi SU8010
Area/room:
Q260: Hitach and Zeiss SEM
Category:
Metrology
Manufacturer:
Hitachi
Model:
SU8010
Instructors & Licensed Users
Instructors
Licensed Users
Tool Modes
You must be logged in to view tool modes.
This may take a while...please wait.
×
User Information
Name:
Telephone:
Mobile:
E-mail:
University/Company:
Laboratory:
Send Message
Subject:
Message:
Send